We use necessary cookies to make our site work. We'd also like to set optional analytics cookies to help us improve it. We won't set optional cookies unless you enable them.
Necessary cookies enable core functionality such as security, network management, and accessibility. We do not use cookies for marketing purposes.
We utilise Google Analytics cookies to help us to improve our website by collecting information on how it's used. Find out more
The purpose of this guide is to describe good practice for the measurement and characterisation of rough surface topography using coherence scanning interferometry (commonly referred to as vertical scanning white light interferometry).
15 Dec 2010 pdf
Download
Our research and measurement solutions support innovation and product development. We work with companies to deliver business advantage and commercial success. Contact our Customer Services team on +44 20 8943 7070