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dXCT conference

dXCT conference 2016

Tuesday 10 May 2016 – National Physical Laboratory, Teddington, UK

NPL's Engineering Measurement Division successfully launched DXCT, the UK's first international scientific conference dedicated to Dimensional X-ray Computed Tomography, on Tuesday 10 May 2016. More than 100 delegates, from 46 companies and research organisations, attended the event at NPL, including: Airbus, Rolls-Royce, AWE, Diamond Light Source and the National History Museum.

The purpose of the conference was to coordinate the strategy in a rapidly-growing area of metrology. 14 invited speakers from industry and academia took to the stage, presenting technical issues and needs relating to high precision X-ray computed tomography (XCT) on a variety of topics ranging from: how improved XCT could in the future help deliver greener engines, to the increased use of additive manufacturing in high performance aero parts, and onto improving survival rates in tumour diagnostics. Additionally, 16 academic poster papers enriched the conference, with a diversity of thought-provoking scientific insights into XCT. The conference concluded with an extended period of lively panel discussions, attended by over 90% of the delegates. This diverse panel, consisting of representatives from industry, academia and heritage, together with considerable input from the audience, discussed issues with dimensional XCT systems and how NPL could help users benefit from this exciting and emerging technology. There was an overwhelming desire for the conference to become an annual event.

Find out more about NPL's work on X-ray Computed Tomography

Speakers

  • Michael McCarthy, National Physical Laboratory

  • Paul Bills, University of Huddersfield

  • Andrew Lodge, Rolls-Royce

  • Robert Speller, University College London

  • Moataz Attallah, University of Birmingham

  • Ian Sinclair, University of Southampton

  • David Bate, Nikon Metrology

  • David Eatock, Airbus Group Innovations

  • Wenjuan Sun and Stephen Brown, National Physical Laboratory

  • Joseph Lifton, University of Southampton

  • Robert Atwood, Diamond Light Source

  • Jay Warnett, University of Warwick

  • Nick Brierley, Manufacturing Technology Centre

Organising committee

Conference delegate pack

Delegate pack

Oral presentations

All available downloads are PDF files where Permission to Publish have been granted.

Session 1

Developments towards verifying the performance of dimensional XCT systems - Michael McCarthy, National Physical Laboratory, UK

Characterization of complex additive manufactured structures for the medical device industry using computed tomography - Paul Bills, EPSRC Centre for Innovative Manufacturing in Advanced Metrology, University of Huddersfield, UK

CT Measurement of turbine blades, present and future - Andrew Lodge, Rolls-Royce plc, UK

Session 2

Quantitative analysis of tissue using microCT - Robert Speller, University College London, UK

XCT as a method for analysing the influence of SLM laser processing parameters on porosity - Moataz Attallah

Application of computed tomography in damage measurement and simulation in structural composites - Ian Sinclair, University of Southampton, UK

Error sources in CT systems and practical methods of correction - David Bate, Nikon Metrology, UK

Session 3

XCT applications in aerospace additive manufacturing - David Eatock, Airbus Group Innovations, UK

Developments in dimensional metrology in XCT at NPL - Wenjuan Sun and Stephen Brown, National Physical Laboratory, UK

On the influence of scatter in X-ray CT for dimensional metrology - Joseph Lifton, University of Southampton, Malaysia Campus

Towards accurate measurements with synchrotron tomography: problems and pitfalls - Robert Atwood, Diamond Light Source, UK

Session 4

Towards in-process x-ray CT for dimensional metrology - Jay Warnett, University of Warwick, UK

The state of the art in radiography: computed tomography for production - Nick Brierley, Manufacturing Technology Centre, UK

Poster presentations

  • NPL

  • WMG, University of Warwick

  • Aegleteq

  • Avizo (FEI)

  • Blue Scientific

  • CCPi Tomographic Imaging

  • GE

  • Hamamatsu Photonics

  • High Value Manufacturing Catapult

  • LaVision

  • Nikon

  • Synopsys (Simpleware)

  • Zeiss

Conference sponsors

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