Andrew leads our nanometrology work. He joined NPL in 1991 and has developed combined optical and X-ray Interferometry, metrological atomic force microscopy and X-ray interferometry and nanopositioning metrology. He collaborates extensively with other European national metrology Institutes and has over forty peer reviewed papers. Andrew is a Fellow of the Institute of Physics, an editor of the leading Institute of Physics Journal, Measurement Science and Technology, chairs the Consultative Committee for Length’s working group on Dimensional Nanometrology and is a member of the Institute of Physics Special Interest Group on Nanophysics and Technology.
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